Degradation Mechanism of Phenol in C/PTFE O2-Fed Cathode by Determining the Product of Oxygen Electroreduction

Hui WANG, Xiu Juan YU, De Zhi SUN

　

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Chinese Chemical Letters ›› 2005, Vol. 16 ›› Issue (08) : 1129-1132.
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Degradation Mechanism of Phenol in C/PTFE O2-Fed Cathode by Determining the Product of Oxygen Electroreduction

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