A NOVEL IN-SITU SPECTROELECTROCHEMICAL TECHNIQUE WITH PROBE BEAM DEFLECTION:FOR STUDY OF THE ION EXCHANGE BETWEEN FILMS ON ELECTRODE SURFACE AND SOLUTIONS

A NOVEL IN-SITU SPECTROELECTROCHEMICAL TECHNIQUE WITH PROBE BEAM DEFLECTION:FOR STUDY OF THE ION EXCHANGE BETWEEN FILMS ON ELECTRODE SURFACE AND SOLUTIONS

Jing Hong LI, Guang Jin CHENG, Chang Wei LIU, Ju Guang JIN, Shao Jun DONG

　

Search
Submit
E-mail
RSS

Chinese Chemical Letters ›› 1995, Vol. 6 ›› Issue (11) : 983-986.

Article

A NOVEL IN-SITU SPECTROELECTROCHEMICAL TECHNIQUE WITH PROBE BEAM DEFLECTION:FOR STUDY OF THE ION EXCHANGE BETWEEN FILMS ON ELECTRODE SURFACE AND SOLUTIONS

{{article.zuoZhe_EN}}

Author information +

History +

HeighLight

{{article.keyPoints_en}}

Abstract

{{article.zhaiyao_en}}

Key words

Cite this article

Download Citations

{{article.zuoZheEn_L}}. {{article.title_en}}. {{journal.qiKanMingCheng_EN}}. 1995, 6(11): 983-986

References

Publishing order | Descend order by publishing year | Descend order by cited within

References

{{article.reference}}

Funding

RIGHTS & PERMISSIONS

{{article.copyrightStatement_en}}

{{article.copyrightLicense_en}}

Accesses

Citation

Detail

Sections

Recommended

/

〈

〉