IN SITU X-RAY DIFFRACTION CHARACTERIZATION OF SILVER/SOLUTION INTERFACES

Chang Guo CHEN, Ji Hong YI, Zong Qing HUANG

　

Search
Submit
E-mail
RSS
Chinese Chemical Letters ›› 1992, Vol. 3 ›› Issue (04) : 303-304.
Article

IN SITU X-RAY DIFFRACTION CHARACTERIZATION OF SILVER/SOLUTION INTERFACES

    {{javascript:window.custom_author_en_index=0;}}
  • {{article.zuoZhe_EN}}
Author information +
History +

HeighLight

{{article.keyPoints_en}}

Abstract

{{article.zhaiyao_en}}

Key words

Cite this article

EndNote

Ris (Procite)

Bibtex

Download Citations
{{article.zuoZheEn_L}}. {{article.title_en}}. {{journal.qiKanMingCheng_EN}}. 1992, 3(04): 303-304

References

Publishing order | Descend order by publishing year | Descend order by cited within

References

{{article.reference}}

Funding

RIGHTS & PERMISSIONS

{{article.copyrightStatement_en}}
{{article.copyrightLicense_en}}

Accesses

Citation

Detail
Sections
Recommended
Copyright © Editorial Office of Chinese Chemical Letters
Address: 1 Xian Nong Tan Street, Xicheng District, Beijing, China　Zip code: 100050
Phone: 86-10-63165638　Email: cclbj@imm.ac.cn

/

〈 〉