Electron trap-induced charge accumulation and surface reaction kinetics synergistically enhance overall nitrogen photofixation

Longjian Li, Ping Zhang, Yongchong Yu, Reyila Tuerhong, Xiaoping Su, Lijuan Han, Enzhou Liu, Jizhou Jiang

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Chinese Chemical Letters ›› 2025, Vol. 36 ›› Issue (08) : 111118. DOI: 10.1016/j.cclet.2025.111118
Communications

Electron trap-induced charge accumulation and surface reaction kinetics synergistically enhance overall nitrogen photofixation

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{{article.zuoZheEn_L}}. {{article.title_en}}. {{journal.qiKanMingCheng_EN}}. 2025, 36(08): 111118 https://doi.org/10.1016/j.cclet.2025.111118

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