Rapid ultrasensitive monitoring the single-particle surface-enhanced Raman scattering (SERS) using a dark-field microspectroscopy assisted system

doi:10.1016/j.cclet.2019.07.057

中国化学快报 ›› 2020, Vol. 31 ›› Issue (02) : 473-475. DOI: 10.1016/j.cclet.2019.07.057

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Rapid ultrasensitive monitoring the single-particle surface-enhanced Raman scattering (SERS) using a dark-field microspectroscopy assisted system

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Rapid ultrasensitive monitoring the single-particle surface-enhanced Raman scattering (SERS) using a dark-field microspectroscopy assisted system

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{{article.zuoZheCn_L}}. {{article.title_cn}}. {{journal.qiKanMingCheng_CN}}. 2020, 31(02): 473-475 https://doi.org/10.1016/j.cclet.2019.07.057

{{article.zuoZheEn_L}}. {{article.title_en}}. {{journal.qiKanMingCheng_EN}}. 2020, 31(02): 473-475 https://doi.org/10.1016/j.cclet.2019.07.057

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Received	Revised	Published
2019-06-12	2019-07-25	2020-02-22
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2020-02-22

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